2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS)

Smith, S. (Chair)

Activity: Participating in or organising an event typesParticipation in conference

Description

General Chair for IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS 2020)
Period2020
Event typeConference
LocationEdinburgh, United Kingdom
Degree of RecognitionInternational