Application of Secondary Ion Mass Spectrometry (SIMS) to the study of volatiles in melt inclusions

De Hoog, C. (Invited speaker)

Activity: Academic talk or presentation typesInvited talk

Period6 Sep 2018
Event titleEMAS 2018: Microbeam Analysis in the Earth Sciences
Event typeConference
LocationBristol, United Kingdom
Degree of RecognitionInternational

Keywords

  • SIMS
  • volatiles
  • melt inclusions