ECROFI XXII

De Hoog, C. (Keynote/plenary speaker)

Activity: Participating in or organising an event typesParticipation in conference

Description

Recent advances in the analysis of volatiles and fluid-mobile elements in melt inclusions by Secondary Ion Mass Spectrometry (SIMS)
Period27 Jun 2015
Event typeConference
LocationLeeds, United Kingdom

Keywords

  • secondary ion mass spectrometry
  • melt inclusions
  • volatiles