Murray, Jeremy. (2016). Data for "Chip level characterisation studies of Ni and NiFe electrochemical deposition using test structures ", [dataset]. University of Edinburgh, School of Engineering.
Murray, J., Perry, R., Terry, J., Smith, S., Mount, A. & Walton, A., 29 Mar 2016, Proceedings of IEEE International Conference on Microelectronic Test Structures.p. 178-1836 p.
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Murray, J. (Creator), Walton, A. (Creator) (8 Feb 2016). Data for "Chip level characterisation studies of Ni and NiFe electrochemical deposition using test structures". Edinburgh DataShare. 10.7488/ds/1337