Data for "Chip level characterisation studies of Ni and NiFe electrochemical deposition using test structures"

Jeremy Murray (Creator)
Anthony Walton (Creator)

School of Engineering

Dataset

Data Citation

Murray, Jeremy. (2016). Data for "Chip level characterisation studies of Ni and NiFe electrochemical deposition using test structures ", [dataset]. University of Edinburgh, School of Engineering.

Date made available	8 Feb 2016
Publisher	Edinburgh DataShare

DOI
10.7488/ds/1337

1 Conference contribution

Chip level characterisation studies of Ni and NiFe electrochemical deposition using test structures
Murray, J., Perry, R., Terry, J., Smith, S., Mount, A. & Walton, A., 29 Mar 2016, Proceedings of IEEE International Conference on Microelectronic Test Structures. p. 178-183 6 p.
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Open Access
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Data for "Chip level characterisation studies of Ni and NiFe electrochemical deposition using test structures"

Data Citation

DOI

Research output

Chip level characterisation studies of Ni and NiFe electrochemical deposition using test structures

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