Data for "Chip level characterisation studies of Ni and NiFe electrochemical deposition using test structures"

Jeremy Murray (Creator)
Anthony Walton (Creator)

School of Engineering

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1 Conference contribution

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2016
Chip level characterisation studies of Ni and NiFe electrochemical deposition using test structures
Murray, J., Perry, R., Terry, J., Smith, S., Mount, A. & Walton, A., 29 Mar 2016, Proceedings of IEEE International Conference on Microelectronic Test Structures. p. 178-183 6 p.
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