Atomic Force Microscopy Facility

Facility/equipment: Facility

  • LocationShow on map

    Centre for Science at Extreme Conditions University of Edinburgh Erskine Williamson Building Peter Guthrie Tait Road King's Buildings Edinburgh EH9 3FD United Kingdom

    United Kingdom

Equipments Details

Description

Atomic Force Microscopy (AFM) is a technique used to give information on the topographical, nanomechanical, adhesive, and frictional properties of a sample. This makes it a useful tool for a wide range of applications particularly in material and polymer science, manufacturing, and biological research.

This AFM facility is available to all researchers across the university as well as external users from other universities and industry.

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