Research output per year
Research output per year
Search results
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2011
Test structures and a measurement system for characterising the lifetime of EWOD devices
Gruber, D., Li, Y., Smith, S., Tiwari, A., Deng, F., Stokes, A., Terry, J., Bunting, A., Mackay, C., Langridge-Smith, P. & Walton, A., Apr 2011, 2011 IEEE International Conference on Microelectronic Test Structures (ICMTS). NEW YORK: Institute of Electrical and Electronics Engineers (IEEE), p. 80-84 5 p.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
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2010
Test Structures for Characterising the Integration of EWOD and SAW Technologies for Microfluidics
Li, Y., Fu, Y. Q., Flynn, B., Parkes, W., Liu, Y., Brodie, S., Terry, J., Haworth, L., Bunting, A., Stevenson, T., Smith, S. & Walton, A., 25 Mar 2010, Proceedings of the IEEE International Conference on Microelectronic Test Structures (ICMTS10). Institute of Electrical and Electronics Engineers (IEEE), p. 52-57 6 p.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution