185 MHz Count Rate, 139 dB Dynamic Range Single-Photon Avalanche Diode with Active Quenching Circuit in 130nm CMOS Technology

Research output: Contribution to conference › Paper › peer-review

Original language	English
Pages	278-281
Number of pages	4
Publication status	Published - Jun 2011
Event	International Image Sensor Workshop - , Japan Duration: 14 Jun 2011 → …

Workshop	International Image Sensor Workshop
Country/Territory	Japan
Period	14/06/11 → …

Cite this

@conference{728f65fdd9474392845ec864bd9c238f,

title = "185 MHz Count Rate, 139 dB Dynamic Range Single-Photon Avalanche Diode with Active Quenching Circuit in 130nm CMOS Technology",

author = "A. Eisele and Robert Henderson and B. Schmidtke and T. Funk and Grant, \{L. A.\} and Richardson, \{Justin A.\} and W. Freude",

year = "2011",

month = jun,

language = "English",

pages = "278--281",

note = "International Image Sensor Workshop ; Conference date: 14-06-2011",

}

TY - CONF

T1 - 185 MHz Count Rate, 139 dB Dynamic Range Single-Photon Avalanche Diode with Active Quenching Circuit in 130nm CMOS Technology

AU - Eisele, A.

AU - Henderson, Robert

AU - Schmidtke, B.

AU - Funk, T.

AU - Grant, L. A.

AU - Richardson, Justin A.

AU - Freude, W.

PY - 2011/6

Y1 - 2011/6

M3 - Paper

SP - 278

EP - 281

T2 - International Image Sensor Workshop

Y2 - 14 June 2011

ER -