| Original language | Undefined/Unknown |
|---|---|
| Title of host publication | VLSI Multi-Level Interconnect Conference |
| Pages | 3 |
| Number of pages | 1 |
| Publication status | Published - 1995 |
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A Defect Sensitivity Measurement Tool Enabling Comparison of IC Layout Sensitivity
G. A. Allan, A. J. Walton
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution