A Novel Device for Studying Gate and Channel Edge Effects of IGFET's

J. A. Serack, A. J. Walton, J. M. Robertson, M. Vlcek, M. Vlcek

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageUndefined/Unknown
Title of host publicationIEEE International Conference on Microelectronic Test Structures
Number of pages1
Publication statusPublished - 1988

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