Abstract
A reconfigurable, highly time-interleaved ADC architecture that substantially decouples comparator requirements from input signal bandwidth and system sampling rate constraints is presented. A highly parallel array of low bandwidth, single slope converters achieves low noise and high linearity with very low input capacitance and signal-independent current consumption. A 128-channel counter ADC, implemented in 0.13 μm CMOS, can be configured in real-time as a 1 GSps 7-bit, 500 MSps 8-bit, or 250 MSps 9-bit converter. Central to this approach is a novel parallel slope ramp-generator based on a rotating figure-of-8 resistor ring. The ADC achieves sub 400 fJ/step in all configurations and a near flat SFDR over the entire input signal frequency range. The figure of merit scales favourably to nanometer CMOS technologies.
Original language | English |
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Pages (from-to) | 733 - 748 |
Journal | IEEE Journal of Solid-State Circuits |
Volume | 48 |
Issue number | 3 |
DOIs | |
Publication status | Published - Mar 2013 |
Keywords / Materials (for Non-textual outputs)
- Bottom plate ramping
- TIC ADC
- Time Interleaved Counter ADC
- comparator based ADC
- global ramp generator
- single slope