A Vulnerability Factor for ECC-protected Memory

Luc Jaulmes, Miquel Moretó, Mateo Valero, Marc Casas

Research output: Chapter in Book/Report/Conference proceedingConference contribution


Fault injection studies and vulnerability analyses have been used to estimate the reliability of data structures in memory. We survey these metrics and look at their adequacy to describe the data stored in ECC-protected memory. We also introduce FEA, a new metric improving on the memory derating factor by ignoring a class of false errors. We measure all metrics using simulations and compare them to the outcomes of injecting errors in real runs. This in-depth study reveals that FEA provides more accurate results than any state-of-the-art vulnerability metric. Furthermore, FEA gives an upper bound on the failure probability due to an error in memory, making this metric a tool of choice to quantify memory vulnerability. Finally, we show that ignoring these false errors reduces the failure rate on average by 12.75% and up to over 45%.
Original languageEnglish
Title of host publication2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS)
EditorsDimitris Gizopoulos, Dan Alexandrescu, Panagiota Papavramidou, Michail Maniatakos
Number of pages6
ISBN (Electronic)978-1-7281-2490-2, 978-1-7281-2489-6
ISBN (Print)978-1-7281-2491-9
Publication statusPublished - 3 Oct 2019
Event25th IEEE International Symposium on On-Line Testing and Robust System Design - Rhodes, Greece
Duration: 1 Jul 20193 Jul 2019
Conference number: 25

Publication series

NameIEEE Symposium on On-Line Testing (IOLTS)
ISSN (Print)1942-9398
ISSN (Electronic)1942-9401


Conference25th IEEE International Symposium on On-Line Testing and Robust System Design
Abbreviated titleIOLTS 2019
Internet address


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