An experimental technique for characterizing slow-wave characteristics of MIS-like transmission lines using aqueous dielectrics

Themistoklis Prodromakis*, Christos Papavassiliou

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract / Description of output

This work is a study of the dielectric propagation properties of laminar substrates, which are known to support low dispersion modes with very small phase velocities. Slow modes are linked to a polarization mode supported by the insulatorsemiconductor interface. The mode spectrum of metalinsulatorsemiconductor lines is controlled by the substrate resistivity and the ratio of the semiconductor to insulator layer thicknesses. An experimental investigation of substrate modes normally requires the laborious fabrication of many specimens to cover a useful range of parameter variation. In this paper, we present an experimental platform that supports slow-wave propagation and allows easy adjustment of the parameters affecting the interfacacial polarization mechanism.

Original languageEnglish
Article number5422906
Pages (from-to)985-993
Number of pages9
JournalIEEE Transactions on Microwave Theory and Techniques
Volume58
Issue number4
DOIs
Publication statusPublished - 1 Mar 2010

Keywords / Materials (for Non-textual outputs)

  • Aqueous dielectrics
  • High dielectric
  • Interfacial polarization
  • Maxwell-Wagner
  • Metal-insulator-semiconductor (MIS) lines
  • Slow-wave

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