Analysis of a static undulation on the surface of a thin dielectric liquid layer formed by dielectrophoresis forces

Carl Brown, Glen McHale, Nigel J. Mottram

Research output: Contribution to journalArticlepeer-review

Abstract

A layer of insulating liquid of dielectric constant ɛOil and average thickness coats a flat surface at y = 0 at which a one-dimensional sinusoidal potential V(x,0) = VOcos(πx/p) is applied. Dielectrophoresis forces create a static undulation (or “wrinkle”) distortion h(x) of period p at the liquid/air interface. Analytical expressions have been derived for the electrostatic energy and the interfacial energy associated with the surface undulation when h(x) = -(1/2)Acos(2πx/p) yielding a scaling relationship for A as a function of , p, VO, ɛOil and the surface tension. The analysis is valid as A/p → 0, and in this limit convergence with numerical simulation of the system is shown.
Original languageEnglish
Pages (from-to)024107
Number of pages1
JournalJournal of applied physics
Volume110
Issue number2
DOIs
Publication statusPublished - 22 Jul 2011

Keywords

  • dielectric thin films
  • electrophoresis
  • permittivity
  • surface tension

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