Analysis of Process Traces for Mapping Dynamic KPN Applications to MPSoCs

Andrés Goens, Jeronimo Castrillon

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract / Description of output

Current approaches for mapping Kahn Process Networks (KPN) and Dynamic Data Flow (DDF) applications rely on assumptions on the program behavior specific to an execution. Thus, a near-optimal mapping, computed for a given input data set, may become sub-optimal at run-time. This happens when a different data set induces a significantly different behavior. We address this problem by leveraging inherent mathematical structures of the dataflow models and the hardware architectures. On the side of the dataflow models, we rely on the monoid structure of histories and traces. This structure help us formalize the behavior of multiple executions of a given dynamic application. By defining metrics we have a formal framework for comparing the executions. On the side of the hardware, we take advantage of symmetries in the architecture to reduce the search space for the mapping problem. We evaluate our implementation on execution variations of a randomly-generated KPN application and on a low-variation JPEG encoder benchmark. Using the described methods we show that trace differences are not sufficient for characterizing performance losses. Additionally, using platform symmetries we manage to reduce the design space in the experiments by two orders of magnitude.
Original languageEnglish
Title of host publicationSystem Level Design from HW/SW to Memory for Embedded Systems
EditorsMarcelo Götz, Gunar Schirner, Marco Aurélio Wehrmeister, Mohammad Abdullah Al Faruque, Achim Rettberg
Place of PublicationCham
PublisherSpringer International Publishing Switzerland
Pages116-127
Number of pages12
ISBN (Electronic)978-3-319-90023-0
DOIs
Publication statusPublished - 17 Apr 2018
EventInternational Embedded Systems Symposium 2015 - Foz do Iguacu, Brazil
Duration: 3 Nov 20156 Nov 2015

Conference

ConferenceInternational Embedded Systems Symposium 2015
Abbreviated titleIESS 2015
Country/TerritoryBrazil
CityFoz do Iguacu
Period3/11/156/11/15

Fingerprint

Dive into the research topics of 'Analysis of Process Traces for Mapping Dynamic KPN Applications to MPSoCs'. Together they form a unique fingerprint.

Cite this