Application of Secondary Ion Mass Spectrometry (SIMS) to the study of volatiles in melt inclusions

Research output: Chapter in Book/Report/Conference proceedingChapter (peer-reviewed)peer-review

Original languageEnglish
Title of host publicationMicrobeam Analysis in the Earth Sciences
Place of PublicationAntwerp
PublisherEuropean Microbeam Analysis Society eV
Pages163-172
Volume13
ISBN (Electronic)978 90 8227 694 7
Publication statusPublished - 21 Sep 2018

Keywords

  • SIMS
  • volatiles
  • melt inclusions

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