Application of Secondary Ion Mass Spectrometry (SIMS) to the study of volatiles in melt inclusions

Research output: Chapter in Book/Report/Conference proceeding › Chapter (peer-reviewed) › peer-review

Original language	English
Title of host publication	Microbeam Analysis in the Earth Sciences
Place of Publication	Antwerp
Publisher	European Microbeam Analysis Society eV
Pages	163-172
Volume	13
ISBN (Electronic)	978 90 8227 694 7
Publication status	Published - 21 Sept 2018

Keywords / Materials (for Non-textual outputs)

Application of Secondary Ion Mass Spectrometry (SIMS) to the study of volatiles in melt inclusions
De Hoog, C.-J. (Invited speaker)
6 Sept 2018
Activity: Academic talk or presentation types › Invited talk

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title = "Application of Secondary Ion Mass Spectrometry (SIMS) to the study of volatiles in melt inclusions",

keywords = "SIMS, volatiles, melt inclusions",

author = "\{De Hoog\}, Cees-Jan",

year = "2018",

month = sep,

day = "21",

language = "English",

volume = "13",

pages = "163--172",

booktitle = "Microbeam Analysis in the Earth Sciences",

publisher = "European Microbeam Analysis Society eV",

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T1 - Application of Secondary Ion Mass Spectrometry (SIMS) to the study of volatiles in melt inclusions

AU - De Hoog, Cees-Jan

PY - 2018/9/21

Y1 - 2018/9/21

KW - SIMS

KW - volatiles

KW - melt inclusions

M3 - Chapter (peer-reviewed)

VL - 13

SP - 163

EP - 172

BT - Microbeam Analysis in the Earth Sciences

PB - European Microbeam Analysis Society eV

CY - Antwerp

ER -