Atomic force microscopy and polymers on surfaces

Vasileios Koutsos*

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingChapter

Abstract / Description of output

This chapter presents a concise and simplified version of the fundamental physical ideas of how polymer chains behave when they are in close proximity to surfaces. It also demonstrates the potential, versatility, and flexibility of the Atomic force microscopy (AFM) technique to probe in a direct manner the nanoscale structural and physical properties of polymer monolayers and submonolayers. The study provides several examples of the use of AFM in investigations of the fine structure and local nanomechanical properties of polymer monolayers and submonolayers. The structural regimes depend on many factors such as surface interactions, polymer molecular weight, surface density, solvent conditions, chemical composition, and molecular architecture. The structural properties of these ultrathin polymer films have a profound effect on various chemomechanical properties of the modified surfaces. This chapter also highlights the important role of the AFM as a very appropriate characterization technique and tool for the investigation of materials surfaces that has been modified and processed by polymer monolayers and submonolayers. © 2009

Original languageEnglish
Title of host publicationAtomic Force Microscopy in Process Engineering
PublisherElsevier Ltd
Pages225-244
Number of pages20
ISBN (Print)9781856175173
DOIs
Publication statusPublished - 1 Dec 2009

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