Azimuth dependent reflection anisotropy of oriented thin films

P. D. Lane, G. E. Isted, D. S. Roseburgh, R. J. Cole

Research output: Contribution to journalArticlepeer-review

Abstract / Description of output

A simplified mathematical description of reflection anisotropy spectroscopy (RAS) measurements is presented. The RAS signals of a nanometer film with arbitrarily aligned dielectric axes are investigated. While RAS spectra are found to be relatively insensitive to tilting of the dielectric axes out of the surface plane, the variation of RAS signals with sample azimuthal orientation angle, theta(s), reveals a distinct sin theta(s) effect, superimposed on the previously observed sin 2 theta(s) and sin 4 theta(s) terms, which provides a measure of the tilt angle. (C) 2009 American Institute of Physics. [doi: 10.1063/1.3246147]

Original languageEnglish
Article number141907
Pages (from-to)-
Number of pages3
JournalApplied Physics Letters
Issue number14
Publication statusPublished - 5 Oct 2009


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