Characterization and development of materials for an integrated high-temperature sensor using resistive test structures

A Tabasnikov, A.S. Bunting, J.G. Terry, J. Murray, G Cummins, C Zhao, J Zhou, R Y Fu, M.P.Y Desmulliez, A J Walton, S Smith

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageUndefined/Unknown
Title of host publicationMicroelectronic Test Structures (ICMTS), 2014 International Conference on
PublisherInstitute of Electrical and Electronics Engineers
Pages188-193
Number of pages6
DOIs
Publication statusPublished - Mar 2014
  • SMART microsystems

    Walton, A.

    EPSRC

    1/04/1028/02/15

    Project: Research

Cite this