Characterization of Electronic Displays using CMOS-Compatible Single Photon Avalanche Diode Image Sensors

Hanning Mai*, Istvan Gyongy, Neale Dutton, Robert Henderson, Ian Underwood

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

Advanced CMOS-compatible Single Photon Avalanche Diode Array technology is progressing rapidly and is being deployed in a wide range of applications. We report for the first time the use of a CMOS-compatible Single Photon Avalanche Diode Array to perform detailed optical measurements on pixels of an OLED microdisplay at very high sampling rate, very low light level and over a very wide dynamic range of luminance. This offers a clear demonstration of the huge potential of this Single Photon Avalanche Diode technology to reveal hitherto obscure details of the optical characteristics of individual and groups of OLED pixels.
Original languageEnglish
Pages (from-to)255-261
Number of pages7
JournalJournal of the Society for Information Display
Volume26
Issue number4
Early online date8 May 2018
DOIs
Publication statusPublished - 19 Jun 2018

Keywords

  • CMOS-SPAD
  • display measurement
  • TRANSIENT ELECTROLUMINESCENCE
  • TIME
  • PERFORMANCE
  • ARRAYS
  • BIT

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