Characterization of large-scale non-uniformities in a 20k TDC/SPAD array integrated in a 130nm CMOS process

C. Veerappan, J. Richardson, R. Walker, D. U. Li, M. W. Fishburn, D. Stoppa, F. Borghetti, Y. Maruyama, M. Gersbach, R. K. Henderson, C. Bruschini, E. Charbon

Research output: Contribution to conferenceOtherpeer-review

Abstract

With the emergence of large arrays of high-functionality pixels, it has become critical to characterize the performance non-uniformity of such arrays. In this paper we characterize a 160×128 array of complex pixels, each with a single-photon avalanche diode (SPAD) and a time-to-digital converter (TDC). A study of the array's non-uniformities in terms of the timing resolution, jitter, and photon responsivity is conducted for the pixels at various illumination levels, temperatures, and other operating conditions. In the study we found that, in photon-starved operation, the TDCs exhibit a median resolution of 55ps and a standard deviation of 2 ps. The pixels show a median timing jitter of 140ps. Moreover, we measured negligible variations in photon responsivity while changing the number of active pixels. These findings suggest that the image sensor can be used in highly reliable, large-scale, time-correlated measurements of single photons for biological, molecular, and medical applications. The chip is especially valuable for time-resolved imaging, single-photon counting, and correlation-spectroscopy under many realistic operating conditions.
Original languageEnglish
Pages331-334
Number of pages4
DOIs
Publication statusPublished - Sep 2011
EventESSDERC 2011 - 41st European Solid State Device Research Conference - Helsinki, Finland, United Kingdom
Duration: 12 Sep 201116 Sep 2011

Conference

ConferenceESSDERC 2011 - 41st European Solid State Device Research Conference
CountryUnited Kingdom
CityHelsinki, Finland
Period12/09/1116/09/11

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