Characterization of photonic colloidal single crystals by microradian X-ray diffraction

Job H. J. Thijssen; Andrei V. Petukhov; Dannis C. 't Hart; Arnout Imhof; Catharina H. M. van der Werf; Ruud E. I. Schropp; Alfons van Blaaderen

doi:10.1002/adma.200502732

Characterization of photonic colloidal single crystals by microradian X-ray diffraction

Job H. J. Thijssen, Andrei V. Petukhov, Dannis C. 't Hart, Arnout Imhof, Catharina H. M. van der Werf, Ruud E. I. Schropp, Alfons van Blaaderen

School of Physics and Astronomy

Research output: Contribution to journal › Article › peer-review

Abstract / Description of output

Close-packed and non-close-packed colloidal photonic crystals of silica spheres have been imaged in real space to reveal their 3D structure. Although the lattice spacings are of the order of a micrometer, these crystals can also be characterized in reciprocal space using small-angle X-ray scattering (see figure). After infiltration with silicon (see inset), the internal 3D structure of these photonic crystals can only be probed using X-ray scattering.

Original language	English
Pages (from-to)	1662-+
Number of pages	6
Journal	Advanced Materials
Volume	18
Issue number	13
DOIs	https://doi.org/10.1002/adma.200502732
Publication status	Published - 4 Jul 2006

Keywords / Materials (for Non-textual outputs)

MONODISPERSE SILICA SPHERES
SPONTANEOUS EMISSION
CONTROLLED GROWTH
HARD-SPHERE
SCATTERING
BANDGAP
SYSTEM

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10.1002/adma.200502732

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title = "Characterization of photonic colloidal single crystals by microradian X-ray diffraction",

abstract = "Close-packed and non-close-packed colloidal photonic crystals of silica spheres have been imaged in real space to reveal their 3D structure. Although the lattice spacings are of the order of a micrometer, these crystals can also be characterized in reciprocal space using small-angle X-ray scattering (see figure). After infiltration with silicon (see inset), the internal 3D structure of these photonic crystals can only be probed using X-ray scattering.",

keywords = "MONODISPERSE SILICA SPHERES, SPONTANEOUS EMISSION, CONTROLLED GROWTH, HARD-SPHERE, SCATTERING, BANDGAP, SYSTEM",

author = "Thijssen, {Job H. J.} and Petukhov, {Andrei V.} and Hart, {Dannis C. 't} and Arnout Imhof and {van der Werf}, {Catharina H. M.} and Schropp, {Ruud E. I.} and {van Blaaderen}, Alfons",

year = "2006",

month = jul,

day = "4",

doi = "10.1002/adma.200502732",

language = "English",

volume = "18",

pages = "1662--+",

journal = "Advanced Materials",

issn = "0935-9648",

publisher = "Wiley-VCH Verlag",

number = "13",

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TY - JOUR

T1 - Characterization of photonic colloidal single crystals by microradian X-ray diffraction

AU - Thijssen, Job H. J.

AU - Petukhov, Andrei V.

AU - Hart, Dannis C. 't

AU - Imhof, Arnout

AU - van der Werf, Catharina H. M.

AU - Schropp, Ruud E. I.

AU - van Blaaderen, Alfons

PY - 2006/7/4

Y1 - 2006/7/4

N2 - Close-packed and non-close-packed colloidal photonic crystals of silica spheres have been imaged in real space to reveal their 3D structure. Although the lattice spacings are of the order of a micrometer, these crystals can also be characterized in reciprocal space using small-angle X-ray scattering (see figure). After infiltration with silicon (see inset), the internal 3D structure of these photonic crystals can only be probed using X-ray scattering.

AB - Close-packed and non-close-packed colloidal photonic crystals of silica spheres have been imaged in real space to reveal their 3D structure. Although the lattice spacings are of the order of a micrometer, these crystals can also be characterized in reciprocal space using small-angle X-ray scattering (see figure). After infiltration with silicon (see inset), the internal 3D structure of these photonic crystals can only be probed using X-ray scattering.

KW - MONODISPERSE SILICA SPHERES

KW - SPONTANEOUS EMISSION

KW - CONTROLLED GROWTH

KW - HARD-SPHERE

KW - SCATTERING

KW - BANDGAP

KW - SYSTEM

U2 - 10.1002/adma.200502732

DO - 10.1002/adma.200502732

M3 - Article

SN - 0935-9648

VL - 18

SP - 1662-+

JO - Advanced Materials

JF - Advanced Materials

IS - 13

ER -

Characterization of photonic colloidal single crystals by microradian X-ray diffraction

Abstract / Description of output

Keywords / Materials (for Non-textual outputs)

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