Original language | Undefined/Unknown |
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Title of host publication | IEEE International Conference on Microelectronic Test Structures |
Pages | 5 |
Number of pages | 1 |
Publication status | Published - 2000 |
Characterization of Sub-micron MOS Transistors modified using a focused Ion Beam System
D. W. Travis, C. M. Reeves, A. M. Gundlach, J. T. M. Stevenson, A. J. Walton
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution