Chip level characterisation studies of Ni and NiFe electrochemical deposition using test structures

Jeremy Murray, Richard Perry, Jonathan Terry, Stewart Smith, Andrew Mount, Anthony Walton

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Fingerprint

Dive into the research topics of 'Chip level characterisation studies of Ni and NiFe electrochemical deposition using test structures'. Together they form a unique fingerprint.

Physics & Astronomy