Chip level characterisation studies of Ni and NiFe electrochemical deposition using test structures

Jeremy Murray, Richard Perry, Jonathan Terry, Stewart Smith, Andrew Mount, Anthony Walton

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Search results

  • Finished

    SMART microsystems

    Walton, A.

    EPSRC

    1/04/1028/02/15

    Project: Research