CIGRE/CIRED/UIE JWG C4.110 - voltage dip immunity of equipment in installations - status April 2008

M. Bollen, I. McMichael, M. Stephens, K. Stockman, Sasa Djokic, F. Zavoda, B. Brumsickle, A. McEachern, J. R. Gordon, G. Ethier, R. Neumann

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This paper presents the status of the work, by April 2008, in C4.110, a joint working group by CIGRE, CIRED and UIE. The scope of the working group is to gather technical knowledge on the immunity of equipment, installations and processes against voltage dips, and to use this knowledge in the further development of methods and standards. The activities of the working group are divided in seven ldquochaptersrdquo. Chapters 1 and 7 are introduction and conclusions, respectively. Chapter 2 gives a general description of voltage dips as they appear at the terminals of sensitive equipment. Chapter 3 describes the performance of equipment and processes during voltage dips. This chapter also includes recommendations on the design of processes. In Chapter 4 the results from Chapter 2 and Chapter 3 are combined to set requirements for the dip characteristics that should be included in immunity testing. Chapter 5 is the data gathering chapter, covering data on voltage-dip statistics at different locations, but also data on the economics of equipment immunity and testing. Finally, in Chapter 6, recommendations for immunity objectives will be given. Important contributions of the working group are: a check-list of voltage dip characteristics to be used early in the design of equipment; a methodology to assess the performance of a complete installation and to include voltage-dip performance in the design of the installation; recommendations for characterization testing of equipment against voltage dips; recommendations for voltage-dip immunity of equipment.
Original languageEnglish
Title of host publication13th International Conference on Harmonics and Quality of Power, 2008 (ICHQP 2008)
Pages1-8
DOIs
Publication statusPublished - Sep 2008

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