Compensating mismatch in a dedicated pixel array for moving edge detection

V. Boonsobhak; K. Cameron; D. Renshaw; A. Murray

doi:10.1109/TENCON.2004.1414923

Compensating mismatch in a dedicated pixel array for moving edge detection

V. Boonsobhak, K. Cameron, D. Renshaw, A. Murray

Research output: Contribution to conference › Paper › peer-review

Abstract

This paper describes the implementation of a CMOS edge-detecting pixel array with on-chip adaptation that compensates for intrinsic variation between devices. The adaptation algorithm, based on asymmetric Hebbian training, uses spike timing to adapt out the effects of device mismatch and process variation. Each pixel adapts to background illuminance and provides high-pass filtering output with respect to local positive and negative illuminance transients. Sample chips have been manufactured using a 0.35 μm CMOS technology, and the test results confirming the feasibility of the chosen approach are reported.

Original language	English
Pages	D278-D281
Number of pages	4
DOIs	https://doi.org/10.1109/TENCON.2004.1414923
Publication status	Published - 2004
Event	IEEE TENCON 2004 - 2004 IEEE Region 10 Conference: Analog and Digital Techniques in Electrical Engineering - Chiang Mai, United Kingdom Duration: 21 Nov 2004 → 24 Nov 2004

Conference

Conference	IEEE TENCON 2004 - 2004 IEEE Region 10 Conference: Analog and Digital Techniques in Electrical Engineering
Country	United Kingdom
City	Chiang Mai
Period	21/11/04 → 24/11/04

Keywords

Image edge detection

Access to Document

10.1109/TENCON.2004.1414923

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1 Finished

Silicon spiking systems: collective parallel computation & adaptive
Murray, A., Reekie, M. & Renshaw, D.
EPSRC
1/07/02 → 31/12/05
Project: Research

Cite this

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title = "Compensating mismatch in a dedicated pixel array for moving edge detection",

abstract = "This paper describes the implementation of a CMOS edge-detecting pixel array with on-chip adaptation that compensates for intrinsic variation between devices. The adaptation algorithm, based on asymmetric Hebbian training, uses spike timing to adapt out the effects of device mismatch and process variation. Each pixel adapts to background illuminance and provides high-pass filtering output with respect to local positive and negative illuminance transients. Sample chips have been manufactured using a 0.35 μm CMOS technology, and the test results confirming the feasibility of the chosen approach are reported.",

keywords = "Image edge detection",

author = "V. Boonsobhak and K. Cameron and D. Renshaw and A. Murray",

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year = "2004",

doi = "10.1109/TENCON.2004.1414923",

language = "English",

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Compensating mismatch in a dedicated pixel array for moving edge detection. / Boonsobhak, V.; Cameron, K.; Renshaw, D.; Murray, A.

2004. D278-D281 Paper presented at IEEE TENCON 2004 - 2004 IEEE Region 10 Conference: Analog and Digital Techniques in Electrical Engineering, Chiang Mai, United Kingdom.

Research output: Contribution to conference › Paper › peer-review

TY - CONF

T1 - Compensating mismatch in a dedicated pixel array for moving edge detection

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AU - Cameron, K.

AU - Renshaw, D.

AU - Murray, A.

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N2 - This paper describes the implementation of a CMOS edge-detecting pixel array with on-chip adaptation that compensates for intrinsic variation between devices. The adaptation algorithm, based on asymmetric Hebbian training, uses spike timing to adapt out the effects of device mismatch and process variation. Each pixel adapts to background illuminance and provides high-pass filtering output with respect to local positive and negative illuminance transients. Sample chips have been manufactured using a 0.35 μm CMOS technology, and the test results confirming the feasibility of the chosen approach are reported.

AB - This paper describes the implementation of a CMOS edge-detecting pixel array with on-chip adaptation that compensates for intrinsic variation between devices. The adaptation algorithm, based on asymmetric Hebbian training, uses spike timing to adapt out the effects of device mismatch and process variation. Each pixel adapts to background illuminance and provides high-pass filtering output with respect to local positive and negative illuminance transients. Sample chips have been manufactured using a 0.35 μm CMOS technology, and the test results confirming the feasibility of the chosen approach are reported.

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DO - 10.1109/TENCON.2004.1414923

M3 - Paper

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T2 - IEEE TENCON 2004 - 2004 IEEE Region 10 Conference: Analog and Digital Techniques in Electrical Engineering

Y2 - 21 November 2004 through 24 November 2004

ER -

Compensating mismatch in a dedicated pixel array for moving edge detection

Abstract

Conference

Keywords

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Silicon spiking systems: collective parallel computation & adaptive

Cite this