Compensating mismatch in a dedicated pixel array for moving edge detection

V. Boonsobhak, K. Cameron, D. Renshaw, A. Murray

Research output: Contribution to conferencePaperpeer-review

Abstract

This paper describes the implementation of a CMOS edge-detecting pixel array with on-chip adaptation that compensates for intrinsic variation between devices. The adaptation algorithm, based on asymmetric Hebbian training, uses spike timing to adapt out the effects of device mismatch and process variation. Each pixel adapts to background illuminance and provides high-pass filtering output with respect to local positive and negative illuminance transients. Sample chips have been manufactured using a 0.35 μm CMOS technology, and the test results confirming the feasibility of the chosen approach are reported.
Original languageEnglish
PagesD278-D281
Number of pages4
DOIs
Publication statusPublished - 2004
EventIEEE TENCON 2004 - 2004 IEEE Region 10 Conference: Analog and Digital Techniques in Electrical Engineering - Chiang Mai, United Kingdom
Duration: 21 Nov 200424 Nov 2004

Conference

ConferenceIEEE TENCON 2004 - 2004 IEEE Region 10 Conference: Analog and Digital Techniques in Electrical Engineering
CountryUnited Kingdom
CityChiang Mai
Period21/11/0424/11/04

Keywords

  • Image edge detection

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