Abstract
Reconstructing complex structures from planar cross-sections is a challenging problem, with wide-reaching applications in medical imaging, manufacturing, and topography. Out-of-the-box point cloud reconstruction methods can often fail due to the data sparsity between slicing planes, while current bespoke methods struggle to reconstruct thin geometric structures and preserve topological continuity. This is important for medical applications where thin vessel structures are present in CT and MRI scans. This paper introduces CrossSDF, a novel approach for extracting a 3D signed distance field from 2D signed distances generated from planar contours. Our approach makes the training of neural SDFs contour-aware by using losses designed for the case where geometry is known within 2D slices. Our results demonstrate a significant improvement over existing methods, effectively reconstructing thin structures and producing accurate 3D models without the interpolation artifacts or over-smoothing of prior approaches.
Original language | English |
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Title of host publication | Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition 2025 |
Publisher | Institute of Electrical and Electronics Engineers |
Pages | 1-15 |
Number of pages | 15 |
Publication status | Accepted/In press - 26 Feb 2025 |
Event | The IEEE/CVF Conference on Computer Vision and Pattern Recognition 2025 - Music City Center, Nashville, United States Duration: 11 Jun 2025 → 15 Jun 2025 https://cvpr.thecvf.com/ |
Publication series
Name | Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition |
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Publisher | Institute of Electrical and Electronics Engineers |
ISSN (Print) | 1063-6919 |
ISSN (Electronic) | 2575-7075 |
Conference
Conference | The IEEE/CVF Conference on Computer Vision and Pattern Recognition 2025 |
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Abbreviated title | CVPR 2025 |
Country/Territory | United States |
City | Nashville |
Period | 11/06/25 → 15/06/25 |
Internet address |
Keywords / Materials (for Non-textual outputs)
- computer vision and pattern recognition