Abstract
Advanced CMOS Single Photon Avalanche Diode Arrays have the potential to reveal characteristics of electronic display panels that have, until now, been extremely challenging or impossible to measure routinely. We demonstrate the use of a CMOS SPAD array to make optical measurements of pixels of an OLED microdisplay at very high sampling rates, very low light levels and over a very wide dynamic range.
Original language | English |
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Title of host publication | Society for Information Display International Symposium (Digest of Technical Papers) |
Publisher | Wiley |
Pages | 181-4 |
Number of pages | 4 |
Volume | 49 |
DOIs | |
Publication status | Published - 30 May 2018 |