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Abstract / Description of output
A dual layer single photon avalanche diode (SPAD) pixel implemented in a 3D-stacked CMOS technology is presented. Two SPAD devices are arranged vertically such that the backside illuminated (BSI) top diode and the front side illuminated (FSI) bottom diode form a single pixel unit. The outputs of both 29 µm2 active area devices are connected to quench and processing electronic circuits on the bottom tier. Characterization results of both SPADs shows a peak photon detection probability (PDP) of 28% at 615 nm and 5% at 585nm for the top and bottom devices respectively at 3V excess bias. Dynamic range (DR) extension in single photon counting (SPC) mode by 15 dB and avoidance of pile-up conditions in time correlated single photon counting (TCSPC) mode are demonstrated. Angular response measurements of the pixel to incoming light are also presented. Both SPADs exhibit a low jitter of ∼ 70 ps at 2 V excess bias and 773 nm showing no degradation to temporal resolution.
Original language | English |
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Number of pages | 4 |
Publication status | Published - 23 Jun 2019 |
Event | International Image Sensor Workshop - Snowbird Resort, Snowbird, United States Duration: 23 Jun 2019 → 27 Dec 2019 https://imagesensors.org/2019-international-image-sensor-workshop/ |
Workshop
Workshop | International Image Sensor Workshop |
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Abbreviated title | IISW |
Country/Territory | United States |
City | Snowbird |
Period | 23/06/19 → 27/12/19 |
Internet address |
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Dive into the research topics of 'Dual Layer 3D-Stacked High Dynamic Range SPAD Pixel'. Together they form a unique fingerprint.Projects
- 1 Finished
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Multiplexed 'Touch and Tell' Optical Molecular Sensing and Imaging
1/10/13 → 31/03/19
Project: Research