Edge effects on tree height retrieval using X-band interferometry

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	344-348
Number of pages	5
Journal	IEEE Geoscience and Remote Sensing Letters
Volume	3
Issue number	3
DOIs	https://doi.org/10.1109/LGRS.2006.872398
Publication status	Published - 2006

Access to Document

@article{7cc1e18014dc4171b69f5984ea342981,

title = "Edge effects on tree height retrieval using X-band interferometry",

author = "Iain Woodhouse",

year = "2006",

doi = "10.1109/LGRS.2006.872398",

language = "English",

volume = "3",

pages = "344--348",

journal = "IEEE Geoscience and Remote Sensing Letters",

issn = "1545-598X",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

number = "3",

}