Original language | Undefined/Unknown |
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Title of host publication | 1994 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems |
Pages | 9 |
Number of pages | 1 |
Publication status | Published - 1994 |
Efficient Critical Area Algorithms and Their Application to Yield Improvement and Test Strategies
G. A. Allan, A. J. Walton
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution