Efficient Critical Area Algorithms and Their Application to Yield Improvement and Test Strategies

G. A. Allan, A. J. Walton

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageUndefined/Unknown
Title of host publication1994 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems
Number of pages1
Publication statusPublished - 1994

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