Elastic instabilities induced large surface strain sensing structures (EILS)

Y Li; J.G. Terry; S Smith; A J Walton; Glen McHale; Ben Xu

doi:10.1109/ICMTS.2015.7106116

Elastic instabilities induced large surface strain sensing structures (EILS)

Y Li, J.G. Terry, S Smith, A J Walton, Glen McHale, Ben Xu

School of Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	Proceedings of the 2015 Ieee International Conference on Microelectronic Test Structures (Icmts 2015)
Publisher	Institute of Electrical and Electronics Engineers
Pages	94-99
Number of pages	6
DOIs	https://doi.org/10.1109/ICMTS.2015.7106116
Publication status	Published - 2015

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10.1109/ICMTS.2015.7106116

http://ieeexplore.ieee.org/lpdocs/epic03/wrapper.htm?arnumber=7106116

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@inproceedings{0970298612bc41aba3d78ce3ba2704f9,

title = "Elastic instabilities induced large surface strain sensing structures (EILS)",

author = "Y Li and J.G. Terry and S Smith and Walton, {A J} and Glen McHale and Ben Xu",

year = "2015",

doi = "10.1109/ICMTS.2015.7106116",

language = "English",

pages = "94--99",

booktitle = "Proceedings of the 2015 Ieee International Conference on Microelectronic Test Structures (Icmts 2015)",

publisher = "Institute of Electrical and Electronics Engineers",

address = "United States",

}

Elastic instabilities induced large surface strain sensing structures (EILS). / Li, Y; Terry, J.G.; Smith, S et al.
Proceedings of the 2015 Ieee International Conference on Microelectronic Test Structures (Icmts 2015). Institute of Electrical and Electronics Engineers, 2015. p. 94-99.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - Elastic instabilities induced large surface strain sensing structures (EILS)

AU - Li, Y

AU - Terry, J.G.

AU - Smith, S

AU - Walton, A J

AU - McHale, Glen

AU - Xu, Ben

PY - 2015

Y1 - 2015

UR - http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=ORCID&SrcApp=OrcidOrg&DestLinkType=FullRecord&DestApp=WOS_CPL&KeyUT=WOS:000370379900019&KeyUID=WOS:000370379900019

U2 - 10.1109/ICMTS.2015.7106116

DO - 10.1109/ICMTS.2015.7106116

M3 - Conference contribution

SP - 94

EP - 99

BT - Proceedings of the 2015 Ieee International Conference on Microelectronic Test Structures (Icmts 2015)

PB - Institute of Electrical and Electronics Engineers

ER -

Elastic instabilities induced large surface strain sensing structures (EILS)

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