Elastic instabilities induced large surface strain sensing structures (EILS)

Y Li, J.G. Terry, S Smith, A J Walton, Glen McHale, Ben Xu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationProceedings of the 2015 Ieee International Conference on Microelectronic Test Structures (Icmts 2015)
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages94-99
Number of pages6
DOIs
Publication statusPublished - 2015

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