Elastic instabilities induced large surface strain sensing structures (EILS)

Y Li, J.G. Terry, S Smith, A J Walton, Glen McHale, Ben Xu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationProceedings of the 2015 Ieee International Conference on Microelectronic Test Structures (Icmts 2015)
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Number of pages6
Publication statusPublished - 2015

Cite this