Enhanced K-means Color Clustering Based on SLIC Superpixels Merging incorporated within the Entomology Software: AInsectID

Haleema Sadia, Parvez Alam

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract / Description of output

Superpixel-based segmentation is an important pre-processing step for the simplification of image processing. The subjective nature behind the determination of optimal cluster numbers in segmentation algorithms can result in either underor over-segmentation burdens, depending on the image type. Insect wings, with their intricate color patterns, pose significant challenges for the accurate capture of color diversity in clustering algorithms, assuming a spherical and isotropic cluster distribution is used. This paper introduces a hybrid approach for color clustering in insect wings, integrating the Simple Linear Iterative Clustering (SLIC) method to generate the initial superpixels, and a DeltaE 2000 function the precisely discriminated merging of superpixels. Color differences between superpixels serve to measure homogeneity during the merging process. The proposed new algorithm demonstrates enhanced segmentation as it overcomes the issue of over-segmentation and under-segmentation, as evidenced by the results derived from the Boundary Recall, Rand index, Under-segmentation Error, and Bhattacharyya distance using ground truth data. The Silhouette score and Dunn Index are also used to quantitatively evaluate the efficacy of our new proposed clustering technique.
Original languageEnglish
Title of host publication2024 IEEE International Conference on Evolving and Adaptive Intelligent Systems (EAIS)
PublisherInstitute of Electrical and Electronics Engineers
Number of pages9
ISBN (Electronic)979-8-3503-6623-5
ISBN (Print)979-8-3503-6624-2
DOIs
Publication statusPublished - 26 Jun 2024
EventIEEE International Conference on Evolving and Adaptive Intelligent Systems 2024 (IEEE EAIS 2024) - Universidad Carlos III de Madrid: Campus de Madrid - Puerta de Toledo, Madrid, Spain
Duration: 23 May 202424 May 2024

Publication series

NameIEEE Workshop on Evolving and Adaptive Intelligent Systems (EAIS)
PublisherIEEE
ISSN (Print)2330-4863
ISSN (Electronic)2473-4691

Conference

ConferenceIEEE International Conference on Evolving and Adaptive Intelligent Systems 2024 (IEEE EAIS 2024)
Country/TerritorySpain
CityMadrid
Period23/05/2424/05/24

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