Fabrication and characterisation of p-channel Si/SiGe MODFET

V. Kuznetsov, R. Cheung, K. Werner, E. van der Drift, J. Metselaar, S. Radelaar

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageUndefined/Unknown
Title of host publicationThe British Journal of Non-Destructive Testing
Publication statusPublished - 1993

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