Gamma-ray detection with a 4 pi NaI spectrometer for material analysis

M Mehrhoff, M Aliotta, I J R Baumvol, H W Becker, M Berheide, L Borucki, J Domke, F Gorris, S Kubsky, N Piel, G Roters, C Rolfs, W H Schulte

Research output: Contribution to journalArticlepeer-review

Abstract

A gamma-ray detection system with nearly 4 pi geometry for applications in materials science is described. The energy resolution of the NaI(Tl)-bore hole detector was found to be about 2% for 10 MeV gamma-rays. The total detection efficiency has been determined to be above 80% for gamma-energies between 0.5 and 20 MeV. A precision of the efficiency calibration of about 2% has been obtained for a wide range of gamma-energies. The experimental results were found to be in excellent agreement with computer simulations using the GEANT computer code. The high efficiency of the system combined with its relatively high energy resolution opened a wide range of applications. Examples are the simultaneous detection of light isotopes in thin films by (d,p gamma) nuclear reactions, high depth resolution profiling of isotopes by narrow, low-energy resonances in (p,gamma) reactions, and hydrogen profiling using the 6.4 MeV resonance in the H-1(N-15,alpha gamma)C-12 reaction. (C) 1997 Elsevier Science B.V.

Original languageEnglish
Pages (from-to)671-684
Number of pages14
JournalNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
Volume132
Issue number4
DOIs
Publication statusPublished - Dec 1997

Keywords

  • ION-BEAM ANALYSIS
  • NARROW RESONANCE
  • ENERGY-LEVELS
  • SYSTEM
  • NITROGEN
  • HYDROGEN
  • FILMS
  • SIMULATION
  • O-18

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