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Gamma-ray detection with a 4 pi NaI spectrometer for material analysis
M Mehrhoff, M Aliotta, I J R Baumvol, H W Becker, M Berheide, L Borucki, J Domke, F Gorris, S Kubsky, N Piel, G Roters, C Rolfs, W H Schulte
Research output: Contribution to journal › Article › peer-review