Identifying and Quantifying Variability Within a BiCMOS Process: A Case Study

M. Redford, A. J. Walton, M. Fallon, J. McGinty, G. Michalowicz, C. MacGregor

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageUndefined/Unknown
Title of host publicationIEE Colloquium on Improving the Efficiency of IC Manufacturing Technology,
Pages4
Number of pages1
Publication statusPublished - 1995

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