Investigation of background electron emission in the LUX detector

D. S. Akerib; S. Alsum; H. M. Araújo; X. Bai; J. Balajthy; A. Baxter; E. P. Bernard; A. Bernstein; T. P. Biesiadzinski; E. M. Boulton; B. Boxer; P. Brás; S. Burdin; D. Byram; M. C. Carmona-Benitez; C. Chan; J. E. Cutter; L. de Viveiros; E. Druszkiewicz; A. Fan; S. Fiorucci; R. J. Gaitskell; C. Ghag; M. G. D. Gilchriese; C. Gwilliam; C. R. Hall; S. J. Haselschwardt; S. A. Hertel; D. P. Hogan; M. Horn; D. Q. Huang; C. M. Ignarra; R. G. Jacobsen; O. Jahangir; W. Ji; K. Kamdin; K. Kazkaz; D. Khaitan; E. V. Korolkova; S. Kravitz; V. A. Kudryavtsev; E. Leason; B. G. Lenardo; K. T. Lesko; J. Liao; J. Lin; A. Lindote; M. I. Lopes; A. Manalaysay; R. L. Mannino; N. Marangou; D. N. McKinsey; D. M. Mei; M. Moongweluwan; J. A. Morad; A. St J. Murphy; A. Naylor; C. Nehrkorn; H. N. Nelson; F. Neves; A. Nilima; K. C. Oliver-Mallory; K. J. Palladino; E. K. Pease; Q. Riffard; G. R. C. Rischbieter; C. Rhyne; P. Rossiter; S. Shaw; T. A. Shutt; C. Silva; M. Solmaz; V. N. Solovov; P. Sorensen; T. J. Sumner; M. Szydagis; D. J. Taylor; R. Taylor; W. C. Taylor; B. P. Tennyson; P. A. Terman; D. R. Tiedt; W. H. To; L. Tvrznikova; U. Utku; S. Uvarov; A. Vacheret; V. Velan; R. C. Webb; J. T. White; T. J. Whitis; M. S. Witherell; F. L. H. Wolfs; D. Woodward; J. Xu; C. Zhang

doi:10.1103/PhysRevD.102.092004

Investigation of background electron emission in the LUX detector

D. S. Akerib, S. Alsum, H. M. Araújo, X. Bai, J. Balajthy, A. Baxter, E. P. Bernard, A. Bernstein, T. P. Biesiadzinski, E. M. Boulton, B. Boxer, P. Brás, S. Burdin, D. Byram, M. C. Carmona-Benitez, C. Chan, J. E. Cutter, L. de Viveiros, E. Druszkiewicz, A. FanS. Fiorucci, R. J. Gaitskell, C. Ghag, M. G. D. Gilchriese, C. Gwilliam, C. R. Hall, S. J. Haselschwardt, S. A. Hertel, D. P. Hogan, M. Horn, D. Q. Huang, C. M. Ignarra, R. G. Jacobsen, O. Jahangir, W. Ji, K. Kamdin, K. Kazkaz, D. Khaitan, E. V. Korolkova, S. Kravitz, V. A. Kudryavtsev, E. Leason, B. G. Lenardo, K. T. Lesko, J. Liao, J. Lin, A. Lindote, M. I. Lopes, A. Manalaysay, R. L. Mannino, N. Marangou, D. N. McKinsey, D. M. Mei, M. Moongweluwan, J. A. Morad, A. St J. Murphy, A. Naylor, C. Nehrkorn, H. N. Nelson, F. Neves, A. Nilima, K. C. Oliver-Mallory, K. J. Palladino, E. K. Pease, Q. Riffard, G. R. C. Rischbieter, C. Rhyne, P. Rossiter, S. Shaw, T. A. Shutt, C. Silva, M. Solmaz, V. N. Solovov, P. Sorensen, T. J. Sumner, M. Szydagis, D. J. Taylor, R. Taylor, W. C. Taylor, B. P. Tennyson, P. A. Terman, D. R. Tiedt, W. H. To, L. Tvrznikova, U. Utku, S. Uvarov, A. Vacheret, V. Velan, R. C. Webb, J. T. White, T. J. Whitis, M. S. Witherell, F. L. H. Wolfs, D. Woodward, J. Xu, C. Zhang

School of Physics and Astronomy

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Abstract / Description of output

Dual-phase xenon detectors, as currently used in direct detection dark matter experiments, have observed elevated rates of background electron events in the low energy region. While this background negatively impacts detector performance in various ways, its origins have only been partially studied. In this paper we report a systematic investigation of the electron pathologies observed in the LUX dark matter experiment. We characterize different electron populations based on their emission intensities and their correlations with preceding energy depositions in the detector. By studying the background under different experimental conditions, we identified the leading emission mechanisms, including photoionization and the photoelectric effect induced by the xenon luminescence, delayed emission of electrons trapped under the liquid surface, capture and release of drifting electrons by impurities, and grid electron emission. We discuss how these backgrounds can be mitigated in LUX and future xenon-based dark matter experiments.

Original language	English
Article number	092004
Journal	Physical Review D
Volume	102
Issue number	9
DOIs	https://doi.org/10.1103/PhysRevD.102.092004
Publication status	Published - 10 Nov 2020

Keywords / Materials (for Non-textual outputs)

physics.ins-det

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10.1103/PhysRevD.102.092004

DR12726Accepted author manuscript, 4.56 MB
2004.07791v2

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Akerib, D. S., Alsum, S., Araújo, H. M., Bai, X., Balajthy, J., Baxter, A., Bernard, E. P., Bernstein, A., Biesiadzinski, T. P., Boulton, E. M., Boxer, B., Brás, P., Burdin, S., Byram, D., Carmona-Benitez, M. C., Chan, C., Cutter, J. E., Viveiros, L. D., Druszkiewicz, E., ... Zhang, C. (2020). Investigation of background electron emission in the LUX detector. Physical Review D, 102(9), Article 092004. https://doi.org/10.1103/PhysRevD.102.092004

@article{be3bfad09fb44510ba0dd7dc05ff8023,

title = "Investigation of background electron emission in the LUX detector",

abstract = " Dual-phase xenon detectors, as currently used in direct detection dark matter experiments, have observed elevated rates of background electron events in the low energy region. While this background negatively impacts detector performance in various ways, its origins have only been partially studied. In this paper we report a systematic investigation of the electron pathologies observed in the LUX dark matter experiment. We characterize different electron populations based on their emission intensities and their correlations with preceding energy depositions in the detector. By studying the background under different experimental conditions, we identified the leading emission mechanisms, including photoionization and the photoelectric effect induced by the xenon luminescence, delayed emission of electrons trapped under the liquid surface, capture and release of drifting electrons by impurities, and grid electron emission. We discuss how these backgrounds can be mitigated in LUX and future xenon-based dark matter experiments. ",

keywords = "physics.ins-det",

author = "Akerib, {D. S.} and S. Alsum and Ara{\'u}jo, {H. M.} and X. Bai and J. Balajthy and A. Baxter and Bernard, {E. P.} and A. Bernstein and Biesiadzinski, {T. P.} and Boulton, {E. M.} and B. Boxer and P. Br{\'a}s and S. Burdin and D. Byram and Carmona-Benitez, {M. C.} and C. Chan and Cutter, {J. E.} and Viveiros, {L. de} and E. Druszkiewicz and A. Fan and S. Fiorucci and Gaitskell, {R. J.} and C. Ghag and Gilchriese, {M. G. D.} and C. Gwilliam and Hall, {C. R.} and Haselschwardt, {S. J.} and Hertel, {S. A.} and Hogan, {D. P.} and M. Horn and Huang, {D. Q.} and Ignarra, {C. M.} and Jacobsen, {R. G.} and O. Jahangir and W. Ji and K. Kamdin and K. Kazkaz and D. Khaitan and Korolkova, {E. V.} and S. Kravitz and Kudryavtsev, {V. A.} and E. Leason and Lenardo, {B. G.} and Lesko, {K. T.} and J. Liao and J. Lin and A. Lindote and Lopes, {M. I.} and A. Manalaysay and Mannino, {R. L.} and N. Marangou and McKinsey, {D. N.} and Mei, {D. M.} and M. Moongweluwan and Morad, {J. A.} and Murphy, {A. St J.} and A. Naylor and C. Nehrkorn and Nelson, {H. N.} and F. Neves and A. Nilima and Oliver-Mallory, {K. C.} and Palladino, {K. J.} and Pease, {E. K.} and Q. Riffard and Rischbieter, {G. R. C.} and C. Rhyne and P. Rossiter and S. Shaw and Shutt, {T. A.} and C. Silva and M. Solmaz and Solovov, {V. N.} and P. Sorensen and Sumner, {T. J.} and M. Szydagis and Taylor, {D. J.} and R. Taylor and Taylor, {W. C.} and Tennyson, {B. P.} and Terman, {P. A.} and Tiedt, {D. R.} and To, {W. H.} and L. Tvrznikova and U. Utku and S. Uvarov and A. Vacheret and V. Velan and Webb, {R. C.} and White, {J. T.} and Whitis, {T. J.} and Witherell, {M. S.} and Wolfs, {F. L. H.} and D. Woodward and J. Xu and C. Zhang",

note = "17 pages, 13 figures",

year = "2020",

month = nov,

day = "10",

doi = "10.1103/PhysRevD.102.092004",

language = "English",

volume = "102",

journal = "Physical Review D",

issn = "1550-7998",

publisher = "American Physical Society",

number = "9",

}

Akerib, DS, Alsum, S, Araújo, HM, Bai, X, Balajthy, J, Baxter, A, Bernard, EP, Bernstein, A, Biesiadzinski, TP, Boulton, EM, Boxer, B, Brás, P, Burdin, S, Byram, D, Carmona-Benitez, MC, Chan, C, Cutter, JE, Viveiros, LD, Druszkiewicz, E, Fan, A, Fiorucci, S, Gaitskell, RJ, Ghag, C, Gilchriese, MGD, Gwilliam, C, Hall, CR, Haselschwardt, SJ, Hertel, SA, Hogan, DP, Horn, M, Huang, DQ, Ignarra, CM, Jacobsen, RG, Jahangir, O, Ji, W, Kamdin, K, Kazkaz, K, Khaitan, D, Korolkova, EV, Kravitz, S, Kudryavtsev, VA, Leason, E, Lenardo, BG, Lesko, KT, Liao, J, Lin, J, Lindote, A, Lopes, MI, Manalaysay, A, Mannino, RL, Marangou, N, McKinsey, DN, Mei, DM, Moongweluwan, M, Morad, JA, Murphy, ASJ, Naylor, A, Nehrkorn, C, Nelson, HN, Neves, F, Nilima, A, Oliver-Mallory, KC, Palladino, KJ, Pease, EK, Riffard, Q, Rischbieter, GRC, Rhyne, C, Rossiter, P, Shaw, S, Shutt, TA, Silva, C, Solmaz, M, Solovov, VN, Sorensen, P, Sumner, TJ, Szydagis, M, Taylor, DJ, Taylor, R, Taylor, WC, Tennyson, BP, Terman, PA, Tiedt, DR, To, WH, Tvrznikova, L, Utku, U, Uvarov, S, Vacheret, A, Velan, V, Webb, RC, White, JT, Whitis, TJ, Witherell, MS, Wolfs, FLH, Woodward, D, Xu, J & Zhang, C 2020, 'Investigation of background electron emission in the LUX detector', Physical Review D, vol. 102, no. 9, 092004. https://doi.org/10.1103/PhysRevD.102.092004

TY - JOUR

T1 - Investigation of background electron emission in the LUX detector

AU - Akerib, D. S.

AU - Alsum, S.

AU - Araújo, H. M.

AU - Bai, X.

AU - Balajthy, J.

AU - Baxter, A.

AU - Bernard, E. P.

AU - Bernstein, A.

AU - Biesiadzinski, T. P.

AU - Boulton, E. M.

AU - Boxer, B.

AU - Brás, P.

AU - Burdin, S.

AU - Byram, D.

AU - Carmona-Benitez, M. C.

AU - Chan, C.

AU - Cutter, J. E.

AU - Viveiros, L. de

AU - Druszkiewicz, E.

AU - Fan, A.

AU - Fiorucci, S.

AU - Gaitskell, R. J.

AU - Ghag, C.

AU - Gilchriese, M. G. D.

AU - Gwilliam, C.

AU - Hall, C. R.

AU - Haselschwardt, S. J.

AU - Hertel, S. A.

AU - Hogan, D. P.

AU - Horn, M.

AU - Huang, D. Q.

AU - Ignarra, C. M.

AU - Jacobsen, R. G.

AU - Jahangir, O.

AU - Ji, W.

AU - Kamdin, K.

AU - Kazkaz, K.

AU - Khaitan, D.

AU - Korolkova, E. V.

AU - Kravitz, S.

AU - Kudryavtsev, V. A.

AU - Leason, E.

AU - Lenardo, B. G.

AU - Lesko, K. T.

AU - Liao, J.

AU - Lin, J.

AU - Lindote, A.

AU - Lopes, M. I.

AU - Manalaysay, A.

AU - Mannino, R. L.

AU - Marangou, N.

AU - McKinsey, D. N.

AU - Mei, D. M.

AU - Moongweluwan, M.

AU - Morad, J. A.

AU - Murphy, A. St J.

AU - Naylor, A.

AU - Nehrkorn, C.

AU - Nelson, H. N.

AU - Neves, F.

AU - Nilima, A.

AU - Oliver-Mallory, K. C.

AU - Palladino, K. J.

AU - Pease, E. K.

AU - Riffard, Q.

AU - Rischbieter, G. R. C.

AU - Rhyne, C.

AU - Rossiter, P.

AU - Shaw, S.

AU - Shutt, T. A.

AU - Silva, C.

AU - Solmaz, M.

AU - Solovov, V. N.

AU - Sorensen, P.

AU - Sumner, T. J.

AU - Szydagis, M.

AU - Taylor, D. J.

AU - Taylor, R.

AU - Taylor, W. C.

AU - Tennyson, B. P.

AU - Terman, P. A.

AU - Tiedt, D. R.

AU - To, W. H.

AU - Tvrznikova, L.

AU - Utku, U.

AU - Uvarov, S.

AU - Vacheret, A.

AU - Velan, V.

AU - Webb, R. C.

AU - White, J. T.

AU - Whitis, T. J.

AU - Witherell, M. S.

AU - Wolfs, F. L. H.

AU - Woodward, D.

AU - Xu, J.

AU - Zhang, C.

N1 - 17 pages, 13 figures

PY - 2020/11/10

Y1 - 2020/11/10

N2 - Dual-phase xenon detectors, as currently used in direct detection dark matter experiments, have observed elevated rates of background electron events in the low energy region. While this background negatively impacts detector performance in various ways, its origins have only been partially studied. In this paper we report a systematic investigation of the electron pathologies observed in the LUX dark matter experiment. We characterize different electron populations based on their emission intensities and their correlations with preceding energy depositions in the detector. By studying the background under different experimental conditions, we identified the leading emission mechanisms, including photoionization and the photoelectric effect induced by the xenon luminescence, delayed emission of electrons trapped under the liquid surface, capture and release of drifting electrons by impurities, and grid electron emission. We discuss how these backgrounds can be mitigated in LUX and future xenon-based dark matter experiments.

AB - Dual-phase xenon detectors, as currently used in direct detection dark matter experiments, have observed elevated rates of background electron events in the low energy region. While this background negatively impacts detector performance in various ways, its origins have only been partially studied. In this paper we report a systematic investigation of the electron pathologies observed in the LUX dark matter experiment. We characterize different electron populations based on their emission intensities and their correlations with preceding energy depositions in the detector. By studying the background under different experimental conditions, we identified the leading emission mechanisms, including photoionization and the photoelectric effect induced by the xenon luminescence, delayed emission of electrons trapped under the liquid surface, capture and release of drifting electrons by impurities, and grid electron emission. We discuss how these backgrounds can be mitigated in LUX and future xenon-based dark matter experiments.

KW - physics.ins-det

U2 - 10.1103/PhysRevD.102.092004

DO - 10.1103/PhysRevD.102.092004

M3 - Article

SN - 1550-7998

VL - 102

JO - Physical Review D

JF - Physical Review D

IS - 9

M1 - 092004

ER -

Investigation of background electron emission in the LUX detector

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