Invited Paper - Single-Photon-Capable Detector Arrays in CMOS: Exploring a New Tool for Display Metrology

Ian Underwood, Hanning Mai, Tarek Al abbas, Istvan Gyongy, Neale Dutton, Robert Henderson

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The technology of CMOS-compatible Single Photon Avalanche Diodes is evolving rapidly and has matured to the point at which it can address the requirements of a range of imaging applications. In this report we consider the current suitability and future potential of CMOS-compatible Single Photon Avalanche Diodes to address the particular application of display metrology.
Original languageEnglish
Title of host publicationInternational Conference on Display Technology (ICDT 2018)
PublisherSociety for Information Display
Pages136-139
Number of pages4
Volume49
DOIs
Publication statusPublished - 28 Nov 2018
EventInternational Conference on Display Technology 2018 - LuoGang Convention Center, Guangzhou, China
Duration: 9 Apr 201813 Apr 2018
http://www.sidchina.org

Conference

ConferenceInternational Conference on Display Technology 2018
Abbreviated titleICDT 2018
Country/TerritoryChina
CityGuangzhou
Period9/04/1813/04/18
Internet address

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