Invited Paper - Single-Photon-Capable Detector Arrays in CMOS: Exploring a New Tool for Display Metrology

Ian Underwood; Hanning Mai; Tarek Al abbas; Istvan Gyongy; Neale Dutton; Robert Henderson

doi:10.1002/sdtp.12838

Invited Paper - Single-Photon-Capable Detector Arrays in CMOS: Exploring a New Tool for Display Metrology

Ian Underwood, Hanning Mai, Tarek Al abbas, Istvan Gyongy, Neale Dutton, Robert Henderson

School of Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract / Description of output

The technology of CMOS-compatible Single Photon Avalanche Diodes is evolving rapidly and has matured to the point at which it can address the requirements of a range of imaging applications. In this report we consider the current suitability and future potential of CMOS-compatible Single Photon Avalanche Diodes to address the particular application of display metrology.

Original language	English
Title of host publication	International Conference on Display Technology (ICDT 2018)
Publisher	Society for Information Display
Pages	136-139
Number of pages	4
Volume	49
DOIs	https://doi.org/10.1002/sdtp.12838
Publication status	Published - 28 Nov 2018
Event	International Conference on Display Technology 2018 - LuoGang Convention Center, Guangzhou, China Duration: 9 Apr 2018 → 13 Apr 2018 http://www.sidchina.org

Conference

Conference	International Conference on Display Technology 2018
Abbreviated title	ICDT 2018
Country/Territory	China
City	Guangzhou
Period	9/04/18 → 13/04/18
Internet address	http://www.sidchina.org

Access to Document

10.1002/sdtp.12838

ICDTV_Invited_Underwood_cleanSubmitted manuscript, 1.26 MB

Cite this

@inproceedings{965d1835598044518998c149b2733ecb,

title = "Invited Paper - Single-Photon-Capable Detector Arrays in CMOS: Exploring a New Tool for Display Metrology",

abstract = "The technology of CMOS-compatible Single Photon Avalanche Diodes is evolving rapidly and has matured to the point at which it can address the requirements of a range of imaging applications. In this report we consider the current suitability and future potential of CMOS-compatible Single Photon Avalanche Diodes to address the particular application of display metrology.",

author = "Ian Underwood and Hanning Mai and {Al abbas}, Tarek and Istvan Gyongy and Neale Dutton and Robert Henderson",

year = "2018",

month = nov,

day = "28",

doi = "10.1002/sdtp.12838",

language = "English",

volume = "49",

pages = "136--139",

booktitle = "International Conference on Display Technology (ICDT 2018)",

publisher = "Society for Information Display",

note = "International Conference on Display Technology 2018, ICDT 2018 ; Conference date: 09-04-2018 Through 13-04-2018",

url = "http://www.sidchina.org",

}

Underwood, I, Mai, H, Al abbas, T, Gyongy, I, Dutton, N & Henderson, R 2018, Invited Paper - Single-Photon-Capable Detector Arrays in CMOS: Exploring a New Tool for Display Metrology. in International Conference on Display Technology (ICDT 2018). vol. 49, Society for Information Display, pp. 136-139, International Conference on Display Technology 2018, Guangzhou, China, 9/04/18. https://doi.org/10.1002/sdtp.12838

TY - GEN

T1 - Invited Paper - Single-Photon-Capable Detector Arrays in CMOS

T2 - International Conference on Display Technology 2018

AU - Underwood, Ian

AU - Mai, Hanning

AU - Al abbas, Tarek

AU - Gyongy, Istvan

AU - Dutton, Neale

AU - Henderson, Robert

PY - 2018/11/28

Y1 - 2018/11/28

N2 - The technology of CMOS-compatible Single Photon Avalanche Diodes is evolving rapidly and has matured to the point at which it can address the requirements of a range of imaging applications. In this report we consider the current suitability and future potential of CMOS-compatible Single Photon Avalanche Diodes to address the particular application of display metrology.

AB - The technology of CMOS-compatible Single Photon Avalanche Diodes is evolving rapidly and has matured to the point at which it can address the requirements of a range of imaging applications. In this report we consider the current suitability and future potential of CMOS-compatible Single Photon Avalanche Diodes to address the particular application of display metrology.

U2 - 10.1002/sdtp.12838

DO - 10.1002/sdtp.12838

M3 - Conference contribution

VL - 49

SP - 136

EP - 139

BT - International Conference on Display Technology (ICDT 2018)

PB - Society for Information Display

Y2 - 9 April 2018 through 13 April 2018

ER -

Invited Paper - Single-Photon-Capable Detector Arrays in CMOS: Exploring a New Tool for Display Metrology

Abstract / Description of output

Conference

Access to Document

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Cite this