Kinetics and Rutherford Backscattering study of the photoinduced solid-state chemical reaction between silver and amorphous $As sub 33 S sub 67 $ layers

T. Wagner; M. Vlcek; M. Frumar; V. Perina; E. Rauhala; J. Saarilahti; P. J. S. Ewen

Kinetics and Rutherford Backscattering study of the photoinduced solid-state chemical reaction between silver and amorphous $As sub 33 S sub 67 $ layers

T. Wagner, M. Vlcek, M. Frumar, V. Perina, E. Rauhala, J. Saarilahti, P. J. S. Ewen

School of Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	Undefined/Unknown
Title of host publication	Proceedings SPIE Conference on Developments in Optical Component Coatings
Pages	11
Number of pages	1
Publication status	Published - 1996

Cite this

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title = "Kinetics and Rutherford Backscattering study of the photoinduced solid-state chemical reaction between silver and amorphous $As sub 33 S sub 67 $ layers",

author = "T. Wagner and M. Vlcek and M. Frumar and V. Perina and E. Rauhala and J. Saarilahti and Ewen, {P. J. S.}",

year = "1996",

language = "Undefined/Unknown",

pages = "11",

booktitle = "Proceedings SPIE Conference on Developments in Optical Component Coatings",

}

Kinetics and Rutherford Backscattering study of the photoinduced solid-state chemical reaction between silver and amorphous $As sub 33 S sub 67 $ layers. / Wagner, T.; Vlcek, M.; Frumar, M.; Perina, V.; Rauhala, E.; Saarilahti, J.; Ewen, P. J. S.

Proceedings SPIE Conference on Developments in Optical Component Coatings. 1996. p. 11.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - Kinetics and Rutherford Backscattering study of the photoinduced solid-state chemical reaction between silver and amorphous $As sub 33 S sub 67 $ layers

AU - Wagner, T.

AU - Vlcek, M.

AU - Frumar, M.

AU - Perina, V.

AU - Rauhala, E.

AU - Saarilahti, J.

AU - Ewen, P. J. S.

PY - 1996

Y1 - 1996

M3 - Conference contribution

SP - 11

BT - Proceedings SPIE Conference on Developments in Optical Component Coatings

ER -