Line scan - structured illumination microscopy super-resolution imaging in thick fluorescent samples

Ondrej Mandula, Martin Kielhorn, Kai Wicker, Gerhard Krampert, Ingo Kleppe, Rainer Heintzmann

Research output: Contribution to journalArticlepeer-review

Abstract

Structured illumination microscopy in thick fluorescent samples is a challenging task. The out-of-focus fluorescence background deteriorates the illumination pattern and the reconstructed images suffer from influence of noise. We present a combination of structured illumination microscopy with line scanning. This technique reduces the out-of-focus fluorescence background, which improves the modulation and the quality of the illumination pattern and therefore facilitates the reconstruction. We present super-resolution, optically sectioned images of a thick fluorescent sample, revealing details of the specimen’s inner structure.
Original languageEnglish
Pages (from-to)24167
JournalOptics Express
Volume20
Issue number22
DOIs
Publication statusPublished - 22 Oct 2012

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