Live demonstrateon: A TiO2 ReRAM parameter extraction method

Ioannis Messaris, Spyridon Nikolaidis, Alexandru Serb, Spyros Stathopoulos, Isha Gupta, Ali Khiat, Themistoklis Prodromakis

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We demonstrate a desktop platform which has the ability of modeling ReRAM TiO2 samples in a highly automated manner. The system consists of a bespoke RRAM characterization instrument that hosts packaged RRAM devices and is operated via a PC. The system's python-based software includes a module that automatically applies strategically chosen sequences of pulses to a test device and then extracts the suitable parameter values for a resistive switching model from the elicited response.

Original languageEnglish
Title of host publicationIEEE International Symposium on Circuits and Systems
Subtitle of host publicationFrom Dreams to Innovation, ISCAS 2017 - Conference Proceedings
PublisherInstitute of Electrical and Electronics Engineers
ISBN (Electronic)9781467368520
DOIs
Publication statusPublished - 28 Sept 2017
Event50th IEEE International Symposium on Circuits and Systems, ISCAS 2017 - Baltimore, United States
Duration: 28 May 201731 May 2017

Publication series

NameProceedings - IEEE International Symposium on Circuits and Systems
ISSN (Print)0271-4310

Conference

Conference50th IEEE International Symposium on Circuits and Systems, ISCAS 2017
Country/TerritoryUnited States
CityBaltimore
Period28/05/1731/05/17

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