Low-power electronic technologies for harsh radiation environments

Jeffrey Prinzie, Firman Mangasa Simanjuntak, Paul Leroux*, Themis Prodromakis

*Corresponding author for this work

Research output: Contribution to journalReview articlepeer-review

Abstract / Description of output

Electronic technologies that can operate in harsh radiation environments are important in space, nuclear and avionic applications. However, radiation-hardened (rad-hard) integrated circuits often require additional processing and more complex configurations than conventional systems. Here we review the development of low-power, rad-hard electronics, examining the underlying phenomena of radiation-induced electronic failure and the design methodologies available with conventional complementary metal–oxide–semiconductor (CMOS) technologies to mitigate the problem. We also explore the potential use and applications of various emerging memory technologies in rad-hard electronics.

Original languageEnglish
Pages (from-to)243-253
Number of pages11
JournalNature Electronics
Volume4
Issue number4
DOIs
Publication statusPublished - 26 Apr 2021

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