MICRO-CT BASED FINITE ELEMENT MODELS PREDICT ACCURATE DISPLACEMENT FIELD MEASURED WITH DEFORMABLE IMAGE REGISTRATION

Y. Chen, E. Dall’Ara, K. Manda, E. Sales, R. Wallace, P. Pankaj, M. Viceconti

Research output: Contribution to conferenceOtherpeer-review

Original languageUndefined/Unknown
Publication statusPublished - 2015

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