Abstract
A description of the reflection anisotropy spectroscopy (RAS) results from oriented thin films is presented. The RAS signals of a 1 nm thick film are simulated to investigate the effect of molecular tilt on the RAS response of the system. Whilst the spectroscopic measurements themselves appear to be relatively insensitive to the effects of the tilt, the variation of the RAS signal with rotation of the sample azimuthal angle sees sensitivity to out of surface plane anisotropy, characterized by a sin theta(s) effect. (C) 2010 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
| Original language | English |
|---|---|
| Pages (from-to) | 1969-1973 |
| Number of pages | 5 |
| Journal | physica status solidi (b) – basic solid state physics |
| Volume | 247 |
| Issue number | 8 |
| DOIs | |
| Publication status | Published - Aug 2010 |