Numerical modeling for atomic force microscopy based impedance imaging

Nick Polydorides, Andreas Kyprianou, Charalambos Charalambous

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	147-156
Journal	Proceedings of the Institution of Mechanical Engineers, Part N: Journal of Nanoengineering and Nanosystems
Volume	219
Issue number	4
Publication status	Published - 2006

Cite this

@article{e4174fbda90a497f8812183fd8843a3a,

title = "Numerical modeling for atomic force microscopy based impedance imaging",

author = "Nick Polydorides and Andreas Kyprianou and Charalambos Charalambous",

year = "2006",

language = "English",

volume = "219",

pages = "147--156",

journal = "Proceedings of the Institution of Mechanical Engineers, Part N: Journal of Nanoengineering and Nanosystems",

issn = "2041-3092",

publisher = "SAGE Publications",

number = "4",

}

TY - JOUR

T1 - Numerical modeling for atomic force microscopy based impedance imaging

AU - Polydorides, Nick

AU - Kyprianou, Andreas

AU - Charalambous, Charalambos

PY - 2006

Y1 - 2006

M3 - Article

SN - 2041-3092

VL - 219

SP - 147

EP - 156

JO - Proceedings of the Institution of Mechanical Engineers, Part N: Journal of Nanoengineering and Nanosystems

JF - Proceedings of the Institution of Mechanical Engineers, Part N: Journal of Nanoengineering and Nanosystems

IS - 4

ER -