Original language | Undefined/Unknown |
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Title of host publication | IEE Colloquium on Testing and Inspection of Electronic Components and Circuits |
Pages | 3 |
Number of pages | 1 |
Publication status | Published - 1987 |
Parametric Testing to Link Design and Fabrication
A. Gribben, J. M. Robertson, A. J. Walton
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution