Preparation and characterization of S-33 samples for S-33(n,alpha)Si-30 cross-section measurements at the n_TOF facility at CERN

n-TOF Collaboration

Research output: Contribution to journalArticlepeer-review

Abstract

Thin S-33 samples for the study of the S-33(n,alpha)Si-30 cross-section at the n_TOF facility at CERN were made by thermal evaporation of S-33 powder onto a dedicated substrate made of kapton covered with thin layers of copper, chromium and titanium. This method has provided for the first time bare sulfur samples a few centimeters in diameter. The samples have shown an excellent adherence with no mass loss after few years and no sublimation in vacuum at room temperature. The determination of the mass thickness of S-33 has been performed by means of Rutherford backscattering spectrometry. The samples have been successfully tested under neutron irradiation.

Original languageEnglish
Pages (from-to)142-147
Number of pages6
JournalNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume890
DOIs
Publication statusPublished - 11 May 2018

Keywords

  • Neutron induced alpha emission
  • Thermal evaporation
  • Rutherford backscattering
  • SULFUR TARGETS
  • DETECTOR

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